Get Analytical Electron Microscopy for Materials Science PDF

By D. Shindo, T. Oikawa, Daisuke Shindo, Tetsuo Oikawa

ISBN-10: 4431669884

ISBN-13: 9784431669883

ISBN-10: 4431703365

ISBN-13: 9784431703365

Analytical electron microscopy is among the strongest instruments this present day for characterization of the complex fabrics that help the nanotechnology of the twenty-first century. during this publication the authors sincerely clarify either the fundamental ideas and the most recent advancements within the box. as well as a primary description of the inelastic scattering technique, an evidence of the constituent is supplied. normal quantitative analytical suggestions utilizing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy also are defined, in addition to elemental mapping ideas. integrated are sections on convergent beam electron diffraction and electron holography using the sphere emission gun. With beneficiant use of illustrations and experimental facts, this ebook is a useful source for someone serious about fabrics characterization, electron microscopy, fabrics technological know-how, crystallography, and instrumentation.

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A rotation angle is almost proportional to the total magnetic fiux of the lens. Thus the image formed by the magnetic lens is, in general, a rota ted image, not the inverted image obtained with an optical leils. Optical axis Electron - 0-(_0 --- N , ! i i! i, a r , b c Fig. 17. Principle of the action in thc electron lens. a Electron pass in the polepiece. b Electron focusing trajectory indicating the distance of the electron trom the optical axis. __________________________________________________________________________________________________________________________________________ strength of the magnetic field in the magnetic lens.

3. 2 8C\J Cle> C W t ----------~==~,Io Exit point (d'o) focus exit, similar to that of the magnetic convex lens. The point source, called the entrance point of a spectrometer, is usually set at the crossover point of the projector lens (the final stage of the image-forming lens system). When the clectrons have various energies, each focus point forms a plane called the energy dispersion plane. Eventually an energy-Ioss spectrum is formed on this plane (Fig. 3). A larger spot size d o at the entrance point produces the correspondingly larger spot size d o' at the dispersion plane, resulting in lower energy resolution.

Ultramicroscopy 25:195 4. Ogura N, Yoshida K, Kojima Y, Saito H (1994) Development of the 25 micron pixel im aging pla te system for TEM. In: Proceedings 13 th International Congress on Electron Microscopy, Paris, vol 1. p 219 5. um pixel size imaging plate for transmission electron microscopes. J Electron Microsc 46:303 References 6. Zuo JM, McCartney MR, Spence JCH (1996) Performance of imaging plates for elcctron recording. Ultramicroscopy 66:35 7. Ishizuka K (1993) Analysis of electron image detection efficiency of slow-scan CCD cameras.

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Analytical Electron Microscopy for Materials Science by D. Shindo, T. Oikawa, Daisuke Shindo, Tetsuo Oikawa


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